ISO 10373-3 ELECTRICAL CARD

ISO 10373-3 contact electrical test tool performs conformance testing with the ISO 7816 specification from an electrical point of view.
ISO 10373-3 ELECTRICAL CARDISO 10373-3 ELECTRICAL CARD
ISO 10373-3 ELECTRICAL CARDISO 10373-3 ELECTRICAL CARD

Use Cases


Our ISO 10373-3 Electrical card validation platform will typically be used in the following contexts :

  • Characterisation of the ISO 7816 interface of a contact smartcard
  • Compliance testing with the ISO 7816 of a contact smartcard

What is ISO 10373-3 ELECTRICAL CARD ?

Our ISO 10373-3 Electrical test suite for contact smartcards will allow you to perform physical test on your device, in terms of consumption, levels of voltages, and support of different clock frequencies The ISO 7816-3 document defines the behavior of contact terminals and smartcards : which signals shall be used, which levels of voltages, which data shall be sent... The ISO 10373-3 document defines methods to check the compliancy of terminals with the ISO 7816-3. Micropross supplies to the market innovative and efficient solutions to perform this compliance checking in an automated manner. The main features of those solutions are :
  • Highly qualitative test plan : several dozens of test cases, to verify all parameters defined in the ISO 7816-3 specification
  • Fully automated operating
  • Automated generation of test reports
  • Open for customisation of the test methods
  • Integrated viewer, for a better failure analysis

Technical Data

This test library will test a contact smartcard, by checking parameters such as :
  • the chip’s consumption
  • the chip’s acceptance of limit parameters, such as Vcc, clock duty cycle, rise and fall times
At the end of the test session, a report is generated, while the User Interface allows the user to check the results, and get the explanation in case there is some failure.
Hardware platform :
Test case coverage :
Dozens of different test scenarii, generating the test conditions defined in the ISO 10373-3 specification, such as :
  • test of the chip’s consumption
  • acceptance of clock limit duty cycle values
  • generation of limit Vil/Vih values
  • generation of limit rise and fall times values
  • application of those values on all pins
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