MP300 C3+CL3

Name: MP300 C3+CL3
Brand: NI - National Instruments

Dual Interface Smart Card Tester

Test tool to perform parametric tests of dual interface micro modules and M2M components (leakage, consumption, Q factor, resonance frequency, ...)

Use Cases

The MP300 C3/CL3 will typically be used in the following contexts :

Initialisation, OS loading, pre-personalisation, personalisation of smartcards, micro-modules, and smart object
Test of micro modules on reel to reel test handlers

Please take into consideration that this product is in an EOL state with the following main milestones :

Last time buy : 30 september 2022
End of technical support and FW updates : 31 august 2023
End of HW support : 31 march 2026 for products purchased after 7 february 2022, and 31 march 2024 for products purchased before 7 february 2022

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What is MP300 C3+CL3 ?

The MP300 C3/CL3 is the market leader for tasks related to test and (pre-) personalisation of dual interface smart cards and smart objects. Used at the factories of the major smart card and chip manufacturers, this tool perfectly integrated the constraints of the production world : high throughput, reliability, and efficiency The main characteristics of the MP300 C3/CL3 are :

Support of ISO 7816, SWP/HCI (ETSI TS 102.613 and ETSI TS 102.622), USB 2.0
Coverage of ISO 14443 A/B, ISO 15693, FeliCa^TM, Mifare^TM, B' (Innovatron), and all NFC Forum tags
Coverage of high speed communication (VHBR) in both ASK and PSK modes
Very flexible in the definition of the test parameters (voltages, clock frequency, field strength, ...)
Performs open/short, leakage, consumption, drivability, parametric testing, resonance frequency, Q factor, ...
Ideal tool to test and personalize form factors such as ID-1 smartcards, SIM (micro SIM, nano SIM), M2M modules, tape of components
Easy to control thanks to its open API
Modular structure : up to 2 MP300 C3/CL3 can be installed on one MP300 mother board
Numerous antennas available, including a dual PCD mode-PICC mode model
Presence of a SAM card reader

Technical Data

Supported protocols

ISO/IEC 7816-3
– T=0 and T=1 protocols : 100% implemented, managed by Firmware and FPGA, accelerated by hardware

SWP/HCI (ETSI TS 102.613 and ETSI TS 102.622)
– SWP transmission : Assisted by hardware
– LLC layers support : ACT, CLT, S-HDLC realised by firmware

USB 2.0
– Available speeds : Low speed, full speed
– Classes : ISO/IEC 7816-12, mass storage, custom protocols

Synchronous chips
– Support of all kind of memory components (SLE 46xx, T2G, …)

ISO/IEC 14443 (proximity)
– Supported data rates :
– 106, 212, 424, 848 kbps
– VHBR optionnal. Support of ASK and PSK modulations
– Asymetrical baudrates supported

B’ (Innovatron)

ISO/IEC 15693 (Vicinity cards)
– Supported data rates :
– Low & high data rate
– 1 out of 4, 1 out of 256
– Tag behaviour :
– 1 sub carrier
– 2 sub carriers

ISO 18000-3 Mode 1

Mifare^TM
– Supported versions : Classic, Light, Ultra Light, Ultra Light C, Desfire

FeliCa^TM
– Supported data rates : 212, 424 kbps

NFC Forum modes
– Peer 2 Peer, Listening, Polling

NFC Forum tags
– Tag type 1 (Innovision Topaz)
– Tag type 2 (Mifare Ultra Light)
– Tag type 3 (FeliCa)
– Tag type 4 (ISO 14443 A/B)

ISO 18092 (NFC-IP1)
– Supported communication mechanisms : Active/passive mode, initiator/target

Raw mode
– Possibility to implement custom protocols

Programmable parameters

Physical parameters (contact interface)
– Voltages
– Vcc : Adjustable from 0V to 10V
– Vol/Voh : 0V to 5V / 1V to 7V
– Vil/Vih : 0.2V to 5V / 1V to 6.8V
– Clock frequency
– ISO 7816 clock :
– Adjustable from 10kHz to 20Mhz
– Duty cycle : can be adjusted from 30% to 70%

Pin states
– All pins can be managed separately

ISO 7816 communication parameters
– Adjustable parameters : All normative timings (WWT, BWT, CWT, …), parity, pull-up resistor

SWP communication parameters
– Available baudrates : 106 kbps, 212 kbps, 424 kbps, 848 kbps, 1,6Mbps
– Adjustable parameters : Activation time, P2, P3 parameters, current detection level

Physical parameters (contactless interface)
– Field strength
– Rise/fall time of the modulation
– Modulation index
– Pause time (ISO 14443 A & ISO 15693)
– Duration of each bit + EOF + SOF (ISO 14443 A)
– Load modulation amplitude (contactless smartcard simulation)
– Load on the reader field (contactless smartcard simulation)

Logical parameters
-Type A pause
– FWT, TR0, TR1, TR2
– Communication speed
– Response time (contactless smartcard simulation)

Available tests

Electrical tests (contact interface)
– Open/short test (on all contacts,current forced can be adjusted)
– Leakage current (all contacts)
– Voltage measurement (all contacts, static, dynamic, burst mode)
– Current measurement (all contacts, static, dynamic, burst mode)
– Parametric tests (V=f(I), I=f(V))
– SWP specific measurement (statistics on SWP S2 current values)

Logical tests
– ISO 7816 and SWP concurrent I/O testing : send frames in ISO and SWP simultaneously

Electrical testing (contact interface)
– Resonance frequency / Q factor :
– Bandwidth : 11 MHz to 22 MHz
– Measurement made in loaded and unloaded manner
– Complex impedance :
– Resistor, Inductance, Capacitance
– Measurement of chip and antenna impedance
– Direct computation of Rp//Cp
– Open/short testing
– Magnetic field measurement (contactless smartcard simulation)

Logical testing
– Numerous timing controlled pre-implemented sequences (ex : Field on to REQA/REQB)
– Anti-tearing test
– Framing (parity error simulation, CRC error, protocol error, timing (short response, long response, …)