MP300 CL3

Name: MP300 CL3
Brand: NI - National Instruments

A Manufacturing Tester For All Types Of Contactless Objects

Test of NFC devices in a production context, by performing the right tests (physical and protocol) to obtain a qualitative screening of NFC devices in a manyfacturing line : MP300 CL3.

Use Cases

The MP300 CL3 will typically be used in the following contexts :

Initialisation, OS loading, pre-personalization, personalization of contactless micro modules, smart cards, inlays
Test in production lines of smart objects, such as NFC devices
Quality inspection of NFC devices
Test of (Qi) WPC compatible devices in a production line

Please take into consideration that this product is in an EOL state with the following main milestones :

Last time buy : 30 september 2022
End of technical support and FW updates : 31 august 2023
End of HW support : 31 march 2026 for products purchased after 7 february 2022, and 31 march 2024 for products purchased before 7 february 2022

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What is MP300 CL3 ?

The MP300 CL3 is dedicated to the test of NFC devices (handsets, tablet PC, smart watch, ...) in a production context. It is able to test all the features of a NFC device that matter (terminal simulation, card simulation, resonance frequency, ...) in an automated, strurdy, operator friendly test tool. The main characteristics of the MP300 CL3 are :

Test in production of contactless smartcards, RFID tags, M2M modules, chip on tape (COT) micro modules, and NFC devices
Coverage of all protocol that matters : ISO 14443 A/B, ISO 15693, FeliCa^TM, Mifare^TM, B' (Innovatron), and all NFC Forum tags
Coverage of high speed communication (VHBR) in both ASK and PSK modes
Total flexibility in the definition of the test parameters (field strength, rise/fall times, modulation index, load modulation amplitude (smartcard simulation), load on the DUT field (smartcard simulation)
Numerous test implemented (resonance frequency, Q factor, complex impedance, field strength measurement, ...)
Ideal tool to test and personalize form factors such as ID-1 smartcards, M2M modules, tape of components (COT), NFC devices
Easy to control thanks to its open API
Numerous antennas available, including a dual PCD mode-PICC mode model
Modularity : possibility to have two MP300 CL3 on the same MP300 mother board
Modularity : possibility to have the MP300 CL3 installed together with a MP300 C3 for test of dual interface micro modules
Presence of a SAM card reader
Ideal tool to perform Mastercard CQM test requirements
Tool ready to test power transmitters in a production context, following the WPC specifications

Download datasheet

Technical Data

Supported protocols

ISO/IEC 14443 (proximity)
– Supported data rates :
– 106, 212, 424, 848 kbps
– VHBR optionnal. Support of ASK and PSK modulations
– Asymetrical baudrates supported

B’ (Innovatron)

ISO/IEC 15693 (Vicinity cards)
– Supported data rates :
– Low & high data rate
– 1 out of 4, 1 out of 256
– Tag behaviour
– 1 sub carrier
– 2 sub carriers

ISO 18000-3 Mode 1

Mifare
– Supported versions : Classic, Light, Ultra Light, Ultra Light C, Desfire

FeliCa
– Supported data rates : 212, 424 kbps

NFC Forum modes
– Peer 2 Peer, Listening, Polling

NFC Forum tag
– Tag type 1 (Innovision Topaz)
– Tag type 2 (Mifare^TM Ultra Light)
– Tag type 3 (FeliCa^TM)
– Tag type 4 (ISO 14443 A/B)

ISO 18092 (NFC-IP1)
– Supported communication mechanisms : Active/passive mode, initiator/target

Raw mode
– Possibility to implement custom protocols

Programmable parameters

Physical parameters (all types)
– Field strength
– Rise/fall time of the modulation
– Modulation index
– Pause time (ISO 14443 A & ISO 15693)
– Duration of each bit + EOF + SOF (ISO 14443 A)
– Load modulation amplitude (contactless smartcard simulation)
– Load on the reader field (contactless smartcard simulation)

Logical parameters
– Type A pause
– FWT, TR0, TR1, TR2
– Communication speed
– Response time (contactless smartcard simulation)

Available tests

Electrical testing for NFC devices
– Test of the NFC device Card Emulation mode :
– Generation of different waveshapes (ISO 14443 A/B, FeliCa^TM, ISO 15693) at different physical conditions (field strength, rise/fall times, modulation index, …)
– Measurement of the NFC device response Load Modulation Amplitude

– Test of the NFC device Reader/Writer mode :
– Generation of different waveshapes (ISO 14443 A/B, FeliCa^TM, ISO 15693) at different physical conditions (load modulation amplitude, positive/negative modulation, …)
– Measurement of the emitted field strength
– Test at different loads on the field
– Characterization of the reader/writer mode waveshapes (rise/fall times, overshoot, modulation index, …)

– Resonance frequency / Q factor
– Measurement done at different field strength
– Correlation with a VNA

Electrical testing of the WPC interface
– Resonance frequency / Q factor
– Measurement of Ir, Vr, and the charger clock frequency
– Sending of packets to perform a full charging procedure (retromodulation adjustable)
– Definition of the modulator type (Resistive or Capacitive)
– Definition of the load of the antenna
– Definition of the matching circuit on the antenna
– Definition of the amount of current used to simulate the presence of a battery

Logical testing

– Numerous timing controlled pre-implemented sequences (ex : Field on to REQA/REQB)
– Anti-tearing test
– Framing (parity error simulation, CRC error, protocol error, timing (short response, long response, …)

– Generation of all WPC (QI) defined frames

Also available
– Complex impedance
– Resistor, Inductance, Capacitance
– Direct computation of Rp//Cp
– Measurement of chip and antenna impedance
– Open/short testing