-T=0 and T=1 protocols : 100% implemented, managed by Firmware and FPGA, accelerated by hardware
- SWP/HCI (ETSI TS 102.613 and ETSI TS 102.622)
-SWP transmission : Assisted by hardware
-LLC layers support : ACT, CLT, S-HDLC realised by firmware
-Available speeds : Low speed, full speed
-Classes : ISO/IEC 7816-12, mass storage, custom protocols
modes supported :
-Standard mode
-Fast mode
-Fast mode plus
-Supports clock stretching, multi master arbitration, anti tearing
-Programmable parameters :
+Setup time, hold time, start and stop condition
+Clock high and low states
+Address width (7 and 10 bits)
+Nack condition
-Data width : 8 bits
-programmable parameters :
+phase, polarity
+anti tearing
-Support of all kind of memory components (SLE 46xx, T2G, …)
Raw mode
-Implementation of custom protocols and support of out of standard chips
Physical parameters
-Vcc : Adjustable from 0V to 10V
-Vol/Voh :
+0V to 5V / 1V to 7V
+All pins can be adjusted independently
-Vil/Vih :
– 0.2V to 5V / 1V to 6.8V
Clock frequency
-ISO 7816 clock :
+Adjustable from 10kHz to 10Mhz
+Duty cycle : can be adjusted from 30% to 70%
-SPI clock :
-Adjustable up to 25MHz
-Pin states
+All pins can be managed separately
- ISO 7816 communication parameters
-Adjustable parameters : All normative timings (WWT, BWT, CWT, …), parity, pull-up resistor
- SWP communication parameters
Available baudrates :
– Any baudrate from 49kbps to 1,9Mbps
– SWP duty cycle adjustable from 0% to 50%
– Adjustable parameters : Activation time, P2, P3 parameters, current detection level
-Voltage classes supported : 1.8V and 3.0V
- Accuracy : 20 ns
- Signals displayed :
– All 8 pins (C1 C2 C3 C4 C6 C7 C8)
– SWP S1, S2
– USB
– Bytes
– Frames
– Trigger states
- I2C start and stop conditions, ACK/NACK, SDA/SCL transitions
- SPI SCK, MOSI, LISO, SS transitions
- Analog information (current, voltage measurement)
– Open/short test (on all contacts,current forced can be adjusted)
– Leakage current (all contacts)
– Voltage measurement (all contacts, static, dynamic, burst mode)
– Current measurement (all contacts, static, dynamic, burst mode)
– Parametric tests (V=f(I), I=f(V))
– SWP specific measurement (statistics on SWP S2 current values)
– Anti tearing (checks the chip’s integrity against accidental removing from the reader)
– All timing measurement
– ISO 7816 and SWP concurrent I/O testing : send frames in ISO and SWP simultaneously