CTS III: the Future of NFC Testing
External Webinar
10/05/2021
R&D tools
Manufacturing Tools
Discover it in preview!
During this webinar dedicated to all our customers, the NI NFC Group has explained why this product is our most ambitious release ever in our NFC product line.
Watch the recording to hear more about this new technological breakthrough!
This webinar will help you discover how this new product release from the NI NFC Group can make you even more successful.
We tackled the following questions (45 min):
ANY QUESTION?
If you need more information or couldn’t attend the webinar, our NFC team is ready to help you!
The webinar “Discuss with NI the Future of NFC Testing” has been hosted by 6 of our specialists:
Stéphane Czeck
NFC Offering Manager
Stéphane Layes
Senior Group Manager R&D
Julien Sulerzycki
Senior Application Engineer
Jocelyn Fauquet
Chief hardware Engineer
Gwenhaël Coray
Software Technical Leader
Angèle Decottignies
NFC Communication Manager
The CTS III is the result of the experience that we have gathered around the last 10 years in the edition of test software for EMVCo and NFC Forum.
It also takes into account all the requests that we’ve got from our customers on the field. The big challenge they are facing today is interoperability. The CTS III gives the possibility to the user to define custom waveforms in order to help them to go deeper in the characterization of their products.